Deep learning for visualization and novelty detection in large X-ray diffraction datasets

  • We apply variational autoencoders (VAE) to X-ray diffraction (XRD) data analysis on both simulated and experimental thin-film data. We show that crystal structure representations learned by a VAE reveal latent information, such as the structural similarity of textured diffraction patterns. While other artificial intelligence (AI) agents are effective at classifying XRD data into known phases, a similarly conditioned VAE is uniquely effective at knowing what it doesn't know: it can rapidly identify data outside the distribution it was trained on, such as novel phases and mixtures. These capabilities demonstrate that a VAE is a valuable AI agent for aiding materials discovery and understanding XRD measurements both "on-the-fly" and during \(\textit {post hoc}\) analysis.

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Metadaten
Author:Lars BankoORCiDGND, Phillip M. MaffettoneORCiDGND, Dennis NaujoksGND, Daniel OldsORCiDGND, Alfred LudwigORCiDGND
URN:urn:nbn:de:hbz:294-99384
DOI:https://doi.org/10.1038/s41524-021-00575-9
Parent Title (English):npj computational materials
Publisher:Nature Publ. Group
Place of publication:London
Document Type:Article
Language:English
Date of Publication (online):2023/06/02
Date of first Publication:2021/07/09
Publishing Institution:Ruhr-Universität Bochum, Universitätsbibliothek
Volume:7
Issue:Article 104
First Page:104-1
Last Page:104-6
Note:
Dieser Beitrag ist auf Grund des DEAL-Springer-Vertrages frei zugänglich.
Institutes/Facilities:Institut für Werkstoffe
Institut für Werkstoffe, Materials Discovery and Interfaces
Dewey Decimal Classification:Technik, Medizin, angewandte Wissenschaften / Ingenieurwissenschaften, Maschinenbau
open_access (DINI-Set):open_access
faculties:Fakultät für Maschinenbau
Licence (English):License LogoCreative Commons - CC BY 4.0 - Attribution 4.0 International