A compact measurement setup for material characterization in W-band based on dielectric waveguides

  • In this contribution, we present a measurement system for material characterization in the millimeter-wave range that requires extremely small amounts of sample material. With the help of a dielectric waveguide, it is possible to measure the complete S-parameters with only one port. Fundamentals regarding dielectric waveguides and algorithms are explained, which form the basis of the measurement system. Within the scope of this work, an existing waveguide system was extended and optimized. In addition, two algorithms were implemented to determine permittivity. Finally, measurements were carried out to prove the function of the measurement setup and compared to existing measurement setups.

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Metadaten
Author:Kerstin OrendORCiDGND, Christoph BaerORCiDGND, Thomas MuschGND
URN:urn:nbn:de:hbz:294-102670
DOI:https://doi.org/10.3390/s22165972
Parent Title (English):Sensors
Publisher:MDPI
Place of publication:Basel, Schweiz
Document Type:Article
Language:English
Date of Publication (online):2023/10/24
Date of first Publication:2022/08/10
Publishing Institution:Ruhr-Universität Bochum, Universitätsbibliothek
Tag:Open Access Fonds
3D printing; dielectric waveguide; material characterization
Volume:22
Issue:16, Article 5972
First Page:5972-1
Last Page:5972-19
Note:
Article Processing Charge funded by the Deutsche Forschungsgemeinschaft (DFG) and the Open Access Publication Fund of Ruhr-Universität Bochum.
Institutes/Facilities:Lehrstuhl für elektronische Schaltungstechnik
Dewey Decimal Classification:Technik, Medizin, angewandte Wissenschaften / Elektrotechnik, Elektronik
open_access (DINI-Set):open_access
faculties:Fakultät für Elektrotechnik und Informationstechnik
Licence (English):License LogoCreative Commons - CC BY 4.0 - Attribution 4.0 International